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DA-400 Series Contour Probes


 

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  • Versatility and powerful performance in a lightweight (8 lbs.) instrument
  • Constant AC or pulsed DC fields with the flip of a switch
    for the location of surface and some sub-surface defects
  • Apply continuous or residual magnetic fields and demagnetize too
  • Use with dry powder, wet fluorescent or visible
  • High impact molded housing
  • One year repair/replacement guarantee
  • Optional Y-400 Yoke Light where shown is available at additional cost


The DA-400 Contour Probe is a portable, self-contained instrument designed to produce a magnetic field on or within ferro-magnetic materials.

The selective AC and pulsed DC functions are built into a single reliable instrument. The AC mode produces an intense AC field for detection of surface defects and demagnetizing after inspection. The DC mode produces an intense pulsed DC field for detection of some subsurface defects.

Controls and solid-state electronics are contained within the high impact molded housing. Articulating legs allow the AC or DC field to be applied to the precise area of inspection on nearly any part of the surface shape... in the lab, factory or field site.

All Parker Contour Probes comply with the requirements of applicable specifications. Certified for European CE requirements.

SPECIFICATIONS

 

DA-400

DA-400S

A-410

A-410S

Physical

8.5" (216 mm) × 10.25" (260mm) × 2.25" (57mm)

Line Voltage Single Phase 115 VAC
50/60 Hz
230 VAC
50/60 Hz
115 VAC
50/60 Hz
230 VAC
50/60 Hz
Line Current 4 A
AC/DC
3 A
AC/DC
4 A
AC
3 A
AC
Duty Cycle

2 minutes on – 2 minutes off

Weight 8.5 lbs (3.8 kg)
Construction

Glass-filled nylon housing
10 foot (3 m) 3-wire power cord

Span

12 in. (305 mm) across poles

Field AC/DC AC/DC AC AC

Price Information

Contour Probe Kits
 

 

Parker Research Corporation, 2642 Enterprise Rd. W., Clearwater FL 33763
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©2012 Parker Research Corporation. Contour Probe® is a registered trademark of Parker Research Corporation.